27th International Conference on Thermal, Mechanical and Multi-Physics
Simulation and Experiments in Microelectronics and Microsystems

Warsaw, Poland | April 19 – 22, 2026

Short Courses

Overview of Short Courses on April 19, 2026

9:00 am – 12:00 pm

Current and Future Challenges and Solutions in AI & HPC System and Thermal Management

Dr. Gamal Refai-Ahmed
AMD, USA

Dr. Gamal Refai‑Ahmed is a globally recognized leader in thermal management, advanced packaging, and high‑performance computing, with innovations that have shaped AI, HPC, telecommunications, and automotive systems. Elected to the National Academy of Engineering in 2024, he is also an IEEE Fellow, Xilinx Fellow, and recipient of major honors including awards from ASME, IEEE Canada, SRC, and Binghamton University. With 150+ patents and 120+ publications, he has driven breakthroughs in cooling technologies, heterogeneous integration, and power architecture across roles at Nortel, ATI, AMD, Xilinx, and GE. An Adjunct Professor at the University of Toronto and SUNY Binghamton, he continues to advance next‑generation engineering through research, leadership, and industry collaboration.

Course description

This course explores the critical role of thermal management and packaging in advancing Artificial Intelligence (AI) and High‑Performance Computing (HPC). It addresses current and emerging challenges through state‑of‑the‑art thermo‑mechanical solutions supported by recent IEEE publications and industry developments. Participants will examine the Heterogeneous Integration Roadmap (HIR) and Advanced Packaging Technologies (MAPT), and learn the Seven Principles shaping next‑generation thermal architectures. Key topics include first‑ and second‑line cooling, direct liquid cooling, immersion cooling, microfluidics, and methods for managing thermal loads beyond 1 kW. Practical examples highlight how to decouple mechanical tolerances while optimizing system‑level thermal performance. The course also covers manufacturing, assembly, and reliability considerations from both package and system perspectives. Designed for thermal, mechanical, reliability, and assembly engineers, it offers interactive discussions and hands‑on insights that can be applied directly to modern AI and HPC system design.

Dr. Gamal Refai-Ahmed

Dr. Gamal Refai-Ahmed
AMD, USA

2:00 pm – 5:00 pm

Warpage Modelling and Validation in Fan-out Wafer/Panel Level Packaging and Assembly Processes

Olaf Wittler
Fraunhofer IZM, Germany

Olaf Wittler is Chief Scientist at Fraunhofer IZM, focusing on reliability simulation for advanced electronic packaging technologies. He holds a Ph.D. in Electrical Engineering from Technische Universität Berlin and has over two decades of experience bridging theory and practice in microelectronics reliability. Olaf has authored and co-authored more than 130 publications and is active in reviewing, teaching, and association work. His research includes warpage prediction in FO-WLP and FO-PLP, reliability of RF packages and materials, advanced damage modeling in power electronics, and substrate/via reliability — advancing robust and sustainable solutions for next-generation electronics.

 

Course description

Fan-out wafer and panel-level packaging (FO-WLP/-PLP) technologies have emerged as key enablers for advanced semiconductor integration, offering high I/O density, improved electrical performance, and cost efficiency. However, one of the most critical challenges in these processes is warpage, which occurs due to complex thermo-mechanical interactions and other shrinkage effects during molding, redistribution layer (RDL) formation and assembly. Excessive warpage and die shift can lead to yield loss, reliability issues, and assembly misalignment.

This tutorial provides a comprehensive overview of warpage modelling methodologies for FO-WLP and -PLP processes. It covers fundamental principles of thermo-mechanical behaviour, material property characterization, and process-induced stress evolution. Both analytical and numerical approaches, including finite element modelling (FEM), will be discussed, along with strategies for model calibration and validation using experimental data. Practical case studies will illustrate how predictive modelling can guide design optimization, material selection, and process control to mitigate warpage risks.

Olaf Wittler - Fraunhofer IZM

Olaf Wittler
Fraunhofer IZM, Germany

2:00 pm – 5:00 pm

Advanced Packaging for MEMS and Sensors

Horst Theuss
Infineon Technologies AG, Germany

Horst Theuss received his PhD degree in Physics from the University of Stuttgart/Max Planck Institute for Metal Research in 1993. His scientific work concentrated on magnetic properties of superconductors, amorphous materials and exchange-coupled thin layers. After a post-doctoral assignment at the IBM Almaden Research Center in San Jose, CA, Horst started his industrial career at Vacuumschmelze GmbH working on ferromagnetic alloys. He joined Infineon Technologies, Regensburg, Germany in 2000. Since then he has been developing package concepts and processes in the fields of discrete semiconductors, wafer level packaging, cavity packaging, materials and system integration. As a Senior Principal he is today responsible for predevelopments with a focus on MEMS and sensors.

 

Course description

Sensors are everywhere! They create data and provide the “food” for the Internet of Things. Which specific requirements distinguish MEMS and sensor packaging from standard assembly? How are these challenges being tackled? Do we need advanced packaging technologies for MEMS? These and more questions will be addressed in the course. From a general introduction into package platforms, we will derive MEMS-specific challenges – e. g. the need for low package induced stress and its impact to MEMS performance, the necessity to create cavities or the implementation of MEMS-specific package materials and processes. The course reviews the state of the art and will be dominated by case studies comprising pressure and impact sensors, microphones, mirrors, magnetic sensors and Radar devices. A further section elaborates on robustness requirements and approaches for risk mitigation in harsh environments.
How does MEMS- and sensor packaging fit into the AI-dominated world of “Advanced Packaging”? Case studies comprise the integration of MEMS-microphones or RF-antennas into Fan-Out-Wafer-Level-Packages. An open discussion on the future of MEMS- and sensor packaging will be appreciated.

Horst Theuss - Infineon Technologies AG

Horst Theuss
Infineon Technologies AG, Germany

2:00 pm – 5:00 pm

8D & FMEA – Managing and Preventing Field (Reliability) Incidents

Willem Dirk van Driel
Technical University of Delft, The Netherlands

Willem van Driel earned his degree in Mechanical Engineering from the Technical University of Eindhoven and later obtained a Ph.D. from Delft University of Technology in the Netherlands. With over 30 years of experience in the field of reliability, his expertise spans diverse application areas, including healthcare, oil and gas exploration, and semiconductors. After a 25-year track record in the electronics industry, he currently holds a full-time professorship at Delft University of Technology. His research interests focus on solid-state lighting, microelectronics and microsystems technologies, virtual prototyping, virtual reliability qualification, and designing for reliability in microelectronics and microsystems.

Course description

This interactive course combines theory with real-world cases and discussions to provide a hands-on learning experience. Led by a instructor with over 25 years of expertise, it covers major and minor field incidents. Participants will learn to manage and prevent issues using the 8D Problem-Solving process and Failure Mode and Effects Analysis (FMEA). These tools help tackle product and process issues, foster continuous improvement, and proactively mitigate risks. Attendees will explore the eight steps of 8D, focusing on identifying, resolving, and preventing recurring problems, forming cross-functional teams, conducting root cause analysis, and implementing corrective actions. Additionally, the course provides insights into identifying failure modes, assessing their impact, and reducing risks in product design and manufacturing. Ideal for professionals in quality management, product design, manufacturing, engineering, and operations, it’s especially valuable for those handling customer complaints or improving product reliability.

Willem Dirk van Driel - Technical University of Delft

Willem Dirk van Driel
Technical University of Delft, The Netherlands